Project leader
ATMELPartners
ST Microelectronics, L2MP, LP3, IMSFunders
FUI,![](https://www.pole-scs.org/wp-content/themes/polescs/assets/images/projet-innovant.png)
MADISON
Innovative Failure Analysis Methods by DyNamic Optical Stimulation
To develop integrated circuit failure analysis methods by coupling dynamic optical stimulation with functional test of integrated circuits in a pre-industrial environment.